SAM.gov · Solicitation

Fabrication of Custom Micropillar Arrays

  • Verified from source 20 days ago
  • Updated 20 days ago
Agency
COMMERCE, DEPARTMENT OF
Office
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | DEPT OF COMMERCE NIST
Type
Solicitation
Kind
contract
Posted
Aug 28, 2026
NAICS
541713
Place
Gaithersburg, MD
Notice ID
f4fb9b5bf41c4a72bffe71b5f70ad9cc
Source
SAM.gov
First seen
Aug 31, 2026, 5:21 AM UTC

Full scope

Dissolve the SB Set Aside for Full and Open Competition SOLICITATION 1333ND26QNB640352 Fabrication of Custom Micropillar Arrays This is a solicitation for commercial supplies prepared in accordance with the format in RFO Subpart 12.2, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotations are being requested, and a separate written solicitation document will not be issued. This solicitation is a Request for Quotation (RFQ). The associated North American Industrial Classification System (NAICS) code for this procurem…

Set-aside Full and Open

Dissolve the SB Set Aside for Full and Open Competition SOLICITATION 1333ND26QNB640352 Fabrication of Custom Micropillar Arrays This is a solicitation for commercial supplies prepared in accordance with the format in RFO Subpart 12.2, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotations are being requested, and a separate written solicitation document will not be issued. This solicitation is a Request for Quotation (RFQ). The associated North American Industrial Classification System (NAICS) code for this procurement is 541713 Research and Development in Nanotechnology with a Small Business Size standard of 1,000 employees. This requirement will be competed as a Total Small Business Set-Aside. The Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST) is looking to develop reference materials for measuring the phosphorus concentration in silicon using Atom Probe Tomography (APT) and other complementary measurement techniques. These materials will be most useful to analysts if provided as pre-sharpened micropillar arrays that are directly compatible with modern atom probe instruments.

Contacts

Full record synced 20 days ago from SAM.gov (data extract)